Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy
In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader-Jarvis method) and Giessibl (matrix method) are investigated with...
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ژورنال
عنوان ژورنال: Beilstein Journal of Nanotechnology
سال: 2012
ISSN: 2190-4286
DOI: 10.3762/bjnano.3.27